

Development Background
Is it possible to develop a measuring instrument that can measure objects lined up at narrow intervals all at once? We have developed this product in response to such customer requests.
There is also a technique where one light source is branched to measure multiple locations and a single light receiving unit is used. However, we have developed a product with three light sources and three photosensors. This eliminates the phenomenon where spots overlap at the light-receiving section, which is a cause of error.
Features
1. Measure 3 locations simultaneously
2. Three independent sensors, no measurement errors or detection errors
3. Integrated sensor and processor
Product Information
Item | Triple Tilt Sensor |
Measurement Sample | Optical plane |
Measurement Method | Autocollimator |
Working Distance | 50mm |
Measurement Area | +/-90arcmin |
Output Rate | 500 times/sec |
*Specifications are subject to change without notice.